Plastics
Our measuring systems use different sensor technologies to measure the thickness, layer thickness or basis weight of plastic films and sheets. Depending on the task and plant situation, the sensors are installed in C-frames, O-frames or traverses.
| Measurement | Measuring method |
|---|---|
| Thickness/Layer Thickness | White Light Interferometer | Infrared |
| Thickness | Chromatic-confocal |
| Basis weight | X-rays/beta-rays |
Thickness/layer thickness measurement with white light interferometer
The measuring systems of the OTM-IS series are designed for precise thickness measurement of single or multilayer transparent plastic films. Probes that can be used in different ways allow optimal adaptation to the measurement object.
The crossbeam enables track measurements at freely selectable positions or continuous measurement of the entire cross profile.
Thickness/layer thickness measurement with infrared spectroscopy
The measuring systems of the OTM-IR series are ideally suited for thickness measurements of thin, single or multi-layer transparent plastic films.
The measuring head is mounted on a crossbeam. This enables track measurements at freely selectable positions or continuous measurement of the entire cross profile.
Chromatic confocal thickness measurement
The measuring systems of the OTM-CC series are an ideal solution for non-contact, high-precision thickness measurement of opaque plastic sheets or other flat products.
The C-frame enables track measurements at freely selectable positions or continuous measurement of the entire cross profile.
Basis weight measurement with X-rays/beta-rays
The measuring systems of the OBM series are ideally suited for measuring the basis weight of various web-shaped products. Depending on the material, X-ray or beta emitters are used.
The measuring systems of the OBM-XO series measure with X-rays. The accelerating voltage can range from <5 KV to 30 KV. The measuring systems of the OBM-BO series measure with beta-rays (Kr-85 or Sr-90).
The O-frame allows track measurements at freely selectable positions or a continuous measurement of the entire cross profile.
